Browse using
OpenLink Faceted Browser
OpenLink Structured Data Editor
LodLive Browser
Formats
RDF:
N-Triples
N3
Turtle
JSON
XML
OData:
Atom
JSON
Microdata:
JSON
HTML
Embedded:
JSON
Turtle
Other:
CSV
JSON-LD
Faceted Browser
Sparql Endpoint
About:
Design for testing
An Entity of Type:
Thing
,
from Named Graph:
http://dbpedia.org
,
within Data Space:
dbpedia-live.demo.openlinksw.com
IC design techniques that include testability features
Property
Value
dbo:
description
IC design techniques that include testability features
(en)
consisteix en tècniques de disseny de CI que afegeixen característiques de provabilitat al disseny d'un producte de maquinari.
(ca)
dbo:
wikiPageExternalLink
http://focus.ti.com/lit/an/ssya002c/ssya002c.pdf
http://www.eng.tau.ac.il/~bengal/SCI_paper.pdf
http://www.corelis.com/education/Tips_DFT_Considerations_Board_Level_Design.htm
http://www.corelis.com/education/Tips_DFT_Considerations_Boundary_Scan_Chain.htm
https://www.xjtag.com/about-jtag/design-for-test-guidelines/
dbo:
wikiPageWikiLink
dbr
:Electromechanics
dbr
:Analog_computer
dbr
:Input/output
dbc
:Electronic_design_automation
dbc
:Design_for_X
dbr
:State_(computer_science)
dbr
:Observability
dbr
:Serial_Vector_Format
dbr
:Fault_grading
dbr
:Functional_verification
dbr
:Wafer_(electronics)
dbr
:Controllability
dbr
:Integrated_circuit_design
dbr
:Netlist
dbr
:Automatic_test_pattern_generation
dbr
:Electronic_design_automation
dbr
:Automatic_test_equipment
dbr
:Clock_signal
dbr
:Multiplexer
dbr
:Computational_complexity_theory
dbr
:Moore's_law
dbr
:Scan_chain
dbr
:Design_for_X
dbr
:Test_compression
dbr
:Logic_gate
dbr
:Printed_circuit_board
dbr
:Built-in_self-test
dbr
:Flip-flop_(electronics)
dbc
:Hardware_testing
dbr
:Automated_testing
dbr
:Iddq_testing
dbr
:Acceptance_test
dbr
:State_space
dbr
:Joint_Test_Action_Group
dbr
:Multi-Chip_Module
dbr
:Memory_(computers)
dbr
:Semiconductor_fabrication
dbr
:Tri-state_buffer
dbp:
wikiPageUsesTemplate
dbt
:Reflist
dbt
:ISBN
dbt
:Refend
dbt
:Refbegin
dbt
:Short_description
dct:
subject
dbc
:Electronic_design_automation
dbc
:Design_for_X
dbc
:Hardware_testing
rdfs:
label
Design for testing
(en)
可测试性设计
(zh)
owl:
sameAs
freebase
:Design for testing
wikidata
:Design for testing
dbpedia-zh
:Design for testing
dbpedia-global
:Design for testing
dbr
:Design for testing
prov:
wasDerivedFrom
wikipedia-en
:Design_for_testing?oldid=1277262927&ns=0
foaf:
isPrimaryTopicOf
wikipedia-en
:Design_for_testing
is
dbo:
academicDiscipline
of
dbr
:Mark_Tehranipoor
is
dbo:
knownFor
of
dbr
:Thomas_W._Williams_(engineer)
is
dbo:
wikiPageDisambiguates
of
dbr
:DFT
is
dbo:
wikiPageRedirects
of
dbr
:Design_for_testability
dbr
:Design_for_testability
dbr
:DFT_mode
dbr
:Design_For_Test
dbr
:Design_for_Test
dbr
:Design_for_Testability
dbr
:Design_for_test
is
dbo:
wikiPageWikiLink
of
dbr
:Software_testability
dbr
:Fault_coverage
dbr
:Rajeev_Madhavan
dbr
:Level-sensitive_scan_design
dbr
:DFT
dbr
:MICKEY
dbr
:Scan_chain
dbr
:Jacob_Savir
dbr
:Mark_Tehranipoor
dbr
:Design_for_testability
dbr
:Intel_Microcode
dbr
:DFT_mode
dbr
:Design_For_Test
dbr
:Design_for_Test
dbr
:Design_for_Testability
dbr
:Design_for_test
is
dbp:
field
of
dbr
:Mark_Tehranipoor
is
dbp:
knownFor
of
dbr
:Thomas_W._Williams_(engineer)
is
foaf:
primaryTopic
of
wikipedia-en
:Design_for_testing
This content was extracted from
Wikipedia
and is licensed under the
Creative Commons Attribution-ShareAlike 4.0 International